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Some Characteristics of X - ray Diffractometer

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    XRD is the abbreviation of X-ray diffraction. The Chinese translation is X-ray Diffraction. Through X-ray diffraction of the material, the diffraction pattern is analyzed to obtain information about the composition of the material, the structure or morphology of atoms or molecules inside the material. Used to determine the atomic and molecular structure of crystals. Wherein the crystal structure causes the incident X-ray beam to diffract into many specific directions. By measuring the angle and intensity of these diffracted beams, crystallographers can produce a three-dimensional image of the electron density in the crystal. According to the electron density, the average position of atoms in the crystal, as well as their chemical bonds and various other information can be determined.

    Some Characteristics of X-ray Diffractometer

    1. X-ray diffractometeradopts a new generation of ceramic X-ray tube technology, with stable focal spot position, small attenuation, and long service life. Moreover, the light pipe is of standard size and has little restriction on users. Because the closed target technology is adopted, the later maintenance is very convenient.
    2. The X-ray diffractometer can automatically change the slit, and the user can freely choose the fixed slit size or fixed measurement area mode.
    3. High - precision vertical goniometer, with the sample placed horizontally, the minimum step size and angle repeatability are both 0.0001 O; Accuracy guarantee of goniometer: the international NIST corundum standard sample user will carry out an on-site inspection to ensure that the angular deviation of all peaks within the full spectrum range does not exceed 0.01 O;
    4. The X-ray diffractometer is 150 times stronger than the conventional detector, and its sensitivity is increased by an order of magnitude.
    5. X-ray diffractometer analysissoftware: easy to use and powerful in function, all parameters are adjusted by dynamic adjustment and what you see is what you get, which is simple and quick.
    6. In the application of thin films, Brooke's new D8A diffractometer adopts Twin - Twin light path design, which can realize automatic switching from slit to mirror and slit to the parallel light slit in the incident and diffracted light paths at the same time. Users only need to select the required optical devices through the pull-down menu on the software, thus solving the problem of manual replacement and re-focusing on a light.
    7. In the application of point light source ( including micro - area, texture and stress ), the new D8A adopts Twist Tube technology, which allows the user to switch the point light source immediately by turning the light pipe 90 degrees without disassembling the light pipe.
    8. For in-situ analysis, the new D8A is equipped with a high and low temperature integrated design, with a temperature range of - 180 oC to + 1600 oC. Switching between high and low-temperature modules requires only replacing the heating module, without replacing the entire sample table. Moreover, the sample table is an automatic height-adjustable sample table, and can handle samples of different heights freely.v
      December 28, 2018 12:46 AM MST
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